White Horse Laboratories Counterfeit Detection Report Week 34
Physical condition results jumped 10 points in Week 34 to over 64% from 54.2% in Week 33. The 2nd consecutive week of improvement. Electrical test yields also inched up to over 72% in Week 34, recovering some ground from Week 33′s 70.8%, which had been the first decline after several weeks of incremental improvement.
With volumes in the industry trending up in August, there is still a significant high-risk list of electrical issues despite the improvement in yields.
Week 34 Quality Report, 2012 Substandard Part Listing
Xilinx XC4VLX40-10FFG1148I (Date Codes 1148 and 1129) – 34% failure - program error.
SEMTECH RCLAMP0J24P (Date Code not marked or labeled) – 50% failure – high clamping voltage, Vc.
Cypress Semiconductor CY37032P44125AXC (Date Code 0833) – 8% failure – ID error.
NXP Semiconductor TDA7057AQ-N2 (Date Code not marked or labeled) – 8%failure – High output.
Xinlinx XC4020E (Date Code 0515) – 9% failure - program error.
Kemet C1206C102J1GACTU (Date Code not marked or labeled) – 40% failure – Low capacitance.
Freescale Semiconductor MC912DG128ACPV-
AVX 06036C225KAT2A (Date Code not marked or labeled) – 78% failure – High dissipation factor, DF.
Littlefuse SMBJ200A (Date Code not marked or labeled) – 64% failure – Low breakdown voltage, Vbr, and high reverse current, Ir.
Toshiba TMPN3150B1AF (Date Codes 0925 and 0903) – 13% failure – open and short pins and bad protective diodes.
Infineon Technology PTFA211801E (Date Code not marked or labeled) – 10% failure – High Idss.