White Horse Laboratories Counterfeit Detection Report Week 50
Yields in both Inspection and Electrical Testing reversed trends from Week 49 with Inspection yields recovering to 55% in Week 50 after sliding for four straight weeks, bottoming out at 50% in Week 49. Yields are based upon buyer acceptance following physical inspection identifies the condition of the devices.
Electrical Testing yields dropped to 61.9% in Week 50 after reaching 68.8% in Week 49. Note below that only one device on the list failed for open/short pins – all others are parametric failures.
Inspection Accept 55.0% Electrical Testing Pass 61.9%
Week 50 Quality Report, 2012 Substandard Part Listing
Texas Instruments LM80CIMTX3/NOPB (Date Code not marked or labeled) – 65% Failure Rate - Typical data 0xAE-0xAF (174-175, 10 mV LSB) is out of specification.
Panasonic EET-HC1J682KJ (Date Code not marked or labeled) - 9.2% Failure Rate -
Low capacitance and high DF.
Maxim MAX4452EUK+T (Date Code not marked or labeled) - 100% Failure Rate - High Is, high Vout high, and low Vout low.
Vishay SI7850DP (Date Code not marked or labeled) – 41.7% Failure Rate – High breakdown.
Xilinx XCR3384XL-12FTG256I (Date Codes 0621 and 0725 ) – 28.6% Failure Rate – Failure loading the bitstream via JTAG and inconsistent pin-out.
Linear Technology LTC3780EG (Date Code 1215) - 50% Failure Rate – Short pins and high resistance.
Fairchild Semiconductor FQP2N40 (Date Code not marked or labeled) – 64.4% Failure Rate – High Vds,low Vgs,high Igss.
Fairchild Semiconductor FQP3N40 (Date Code not marked or labeled) – 74.3% Failure Rate- High Vds and low Vgs.