White Horse Laboratories Counterfeit Detection Report Week 50

White Horse Laboratories Counterfeit Detection Report Week 50Yields in both Inspection and Electrical Testing reversed trends from Week 49 with Inspection yields recovering to 55% in Week 50 after sliding for four straight weeks, bottoming out at 50% in Week 49. Yields are based upon buyer acceptance following physical inspection identifies the condition of the devices.

Electrical Testing yields dropped to 61.9% in Week 50 after reaching 68.8% in Week 49. Note below that only one device on the list failed for open/short pins – all others are parametric failures.

Inspection Accept 55.0%  Electrical Testing Pass 61.9%

Week 50 Quality Report, 2012  Substandard Part Listing

Texas Instruments LM80CIMTX3/NOPB  (Date Code not marked or labeled) – 65% Failure Rate - Typical data 0xAE-0xAF (174-175, 10 mV LSB) is out of specification.

Panasonic EET-HC1J682KJ (Date Code not marked or labeled) - 9.2% Failure Rate -

Low capacitance and high DF.

Maxim MAX4452EUK+T (Date Code not marked or labeled) - 100% Failure Rate - High Is, high Vout high, and low Vout low.

Vishay  SI7850DP (Date Code not marked or labeled) – 41.7% Failure Rate – High breakdown.

Xilinx XCR3384XL-12FTG256I (Date Codes 0621 and 0725 ) – 28.6% Failure Rate – Failure loading the bitstream via JTAG and inconsistent pin-out.

Linear Technology LTC3780EG (Date Code 1215) - 50% Failure Rate – Short pins and high resistance.

Fairchild Semiconductor FQP2N40 (Date Code not marked or labeled) – 64.4% Failure Rate – High Vds,low Vgs,high Igss.

Fairchild Semiconductor FQP3N40 (Date Code not marked or labeled) – 74.3% Failure Rate- High Vds and low Vgs.

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